Probe card

Manufacturing probe card types

- Applied Device Products for Test & Measurements OLED/LCD, LEDs, MEMS, RFID, MOSFET, IGBT, OPTIC, Memory, Logic
- Low Leakage Blade Type Probing Pin Card
- Low Leakage Cantilever Type ( ** < 100fA) Probe Card
- Ultra Low Leakage Current ( ** < 10fA) Probe Card
- General Parametric DC measurement test pin card
- 2W/4W(Kelvin) Coaxial Cable Interface custom Probe Card
- POGO Type Test JIG Interface Cable products(Connector less)

Msys lnc, Probe Card characters

Low Leakage EMI Shielding Probe Card
- LCD/OLED panel tester
- Low Leakage Current(0~100fA) property
- Low Cost Cantilever Type Low Leakage Probe Card(Patent Registered)

Development of manufacturing technology(Patent Registered)

1) electromagnetic shield to minimize measurement interference

2) measurement precision

3) low leakage property

Ordering Low Leakage Probe Card Development and Inspection

Probe Card Probe Needle Array Inspection View

Femto Level Low Leakage product (Low Leakage Femto)
EMI Shielding Cantilever Probe Card Type

Material	Pin Dia	Tip Dia	Spec (Pin Pittch)
W, Brass (Au Plating)	100㎛ ~ 250㎛	10㎛~50㎛	50㎛ ~ 200㎛

Femto Level Low Leakage Product(Low Leakage Femto)
EMI No Shielding Cantilever Probe Card Type

Material	Pin Dia	Tip Dia	Spec (Pin Pittch)
W, Brass (Au Plating)	100㎛~250㎛	10㎛~50㎛	50㎛~200㎛

High Precision Measurement
Ceramic Blade Shielding Probe Card Type

Material	Pin Dia	Tip Dia	Spec (Pin Pittch)
Ceramic Blade	200㎛	15㎛~50㎛	Order Production

8inch Blade Needle Type

Leakage Spec:(1±pF)

Inquiry

Branch manager
(Mok Jeong Han) director

T) 031-734-6031
F) 031-735-6031
E-mail) jhmok6060@mesys.co.kr

Online Inquicy